The May 2018 issue of U.S. Tech features our Article, “Triangulating BGA Faults with Boundary Scan“. View the article to learn how JTAG can be used to detect and diagnose manufacturing defects related to BGA devices.
View the Article
The May 2018 issue of U.S. Tech features our Article, “Triangulating BGA Faults with Boundary Scan“. View the article to learn how JTAG can be used to detect and diagnose manufacturing defects related to BGA devices.
View the Article