This new PhD thesis paper titled “Enabling Effective Error Mitigation in Memory Chips That Use On-Die Error-Correcting Codes” from ETH Zurich researcher Minesh Patel won the IEEE  William C. Carter Award in June 2022. Abstract “Improvements in main memory storage density are primarily driven by process technology scaling, which negatively impacts reliability by exacerbating various …

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Der Beitrag DRAM Chips That Employ On-Die Error Correction & Related Reliability Techniques erschien zuerst auf Electronics Update.