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State-of-the-art 3D Patented Virtual Styling Technology Launched at NYFW

Retail TechYesterday, at New York Fashion Week, Style.me brought some exciting technology to the retail tech revolution. Known for transforming the fashion e-commerce, Style.me has developed proprietary technology in 3D scanning, patented 3D geometric deform, simulation and layering technology. Founded in 2014, Style.me has come a long way. As the go-to for virtual styling solutions, they have recently […]


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State-of-the-art 3D Patented Virtual Styling Technology Launched at NYFW

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